Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for efficient testing of digital integrated circuits

Method and system for efficient testing of digital integrated circuits

US Patent 11494537 · Granted Nov 8, 2022

Estimated economic value: $4,130,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for estimating errors in a sensor network implementing high fr2025
Method for automatically generating assembly and disassembly plans2025
System and method for symbol decoding in high frequency (hf) communication chann2025
System and method for symbol decoding in high frequency (hf) communication chann2025
System and method for model-predictive-control-based micro-assembly control with2025
System and method for model-predictive-control-based micro-assembly control with2025
System and method for determining vehicle component conditions2025
Method and architecture for providing integrated design of cyber-physical system2025
Methods and systems for fault diagnosis2024
Methods and systems for fault diagnosis2024
Methods and systems for fault diagnosis2024
Reduced data representation memory controller and related chiplet sets2024