Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Secondary monitoring system for a machine under test

Secondary monitoring system for a machine under test

US Patent 11480603 · Granted Oct 25, 2022

Estimated economic value: $32,635,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Laser beam based flight path clearing system2025
Method and apparatus for extending operational availability for terrestrial opti2025
Method for computer analysis of as-programmed surface quality of composite struc2025
Free play chatter suppression2025
Large deployable panel with shape memory hinge and load elements2025
System and method for super-resolution imaging2025
Apparatus for controlling multi-rotor vehicle vibrations and related methods2024
Feedforward control of an enclosed space with multiple incoherent excitations2024
Methods and apparatus for variable stiffness supports in aircraft testing2024
Circumferential lap splices for sections of fuselage2024
Adaptive noise cancellation for multi-rotor vehicle2023
Foldable rotor assembly for fixed-wing VTOL aircraft2023