Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for imaging a multi-pillar sample

Method and system for imaging a multi-pillar sample

US Patent 11476079 · Granted Oct 18, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Data acquisition and processing techniques for three-dimensional reconstruction2025
Systems and methods for pre-aligning samples for more efficient processing of mu2024
Systems and apparatuses for contamination-free vacuum transfer of samples2024
Offcut angle determination using electron channeling patterns2023
Method and system for wafer defect inspection2022
Measurement and endpointing of sample thickness2021
Specimen preparation and inspection in a dual-beam charged particle microscope2020
Method of modifying a sample surface layer from a microscopic sample2018
Reinforced sample for transmission electron microscope2017
Specimen holder for a charged particle microscope2017