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Home › Method for analyzing melting curve using bi-functional PNA probe, method for diagnosing microsatellite instability using the same, and kit for diagnosing microsatellite instability

Method for analyzing melting curve using bi-functional PNA probe, method for diagnosing microsatellite instability using the same, and kit for diagnosing microsatellite instability

US Patent 11473126 · Granted Oct 18, 2022

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