Assignee
Inventors
- Joonsu Ji (2 patents)
- Jinwoo Jung (59 patents)
- Taejun KIM (22 patents)
- Serim Lee (1 patents)
{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Probe card test apparatus", "item": "https://www.patentleaderboard.com/patent/11372024"}]}
Skip to contentUS Patent 11372024 · Granted Jun 28, 2022