Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › MEMS tunable VCSEL powered swept source OCT for 3D metrology applications

MEMS tunable VCSEL powered swept source OCT for 3D metrology applications

US Patent 11353318 · Granted Jun 7, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for producing anti-reflective textured surface using additive thin film2025
Combined frequency and angle compounding for speckle reduction in ultrasound ima2024
Combined frequency and angle compounding for speckle reduction in ultrasound ima2024
Mid-infrared vertical cavity laser2022
Widely tunable short-cavity laser2021
MEMS tunable VCSEL powered swept source OCT for 3D metrology applications2021
MEMS tunable VCSEL powered swept source OCT for 3D metrology applications2021
Mid-infrared vertical cavity laser2020
Spectrally shaped tunable short-cavity laser2020
MEMS tunable VCSEL powered swept source OCT for 3D metrology applications2020
MEMS tunable VCSEL powered swept source OCT for 3D metrology applications2020
Agile imaging system2019