Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe cards, system for manufacturing semiconductor device, and method of manufacturing semiconductor device

Probe cards, system for manufacturing semiconductor device, and method of manufacturing semiconductor device

US Patent 11327095 · Granted May 10, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe for testing a semiconductor device and a probe card including the same2024
Fan-out buffer with skew control function, operating method thereof, and probe c2024
Method and apparatus for control energy management system based on reinforcement2023
Stiffener having an elastic portion2022
Test apparatuses including probe card for testing semiconductor devices and oper2022
Test system for measuring propagation delay time of transmission line2019