Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Sample thickness measuring arrangement and method for measuring a thickness of a sample at cryogenic temperature by interferometry using a cryostat

Sample thickness measuring arrangement and method for measuring a thickness of a sample at cryogenic temperature by interferometry using a cryostat

US Patent 11307020 · Granted Apr 19, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cooling of a Dewar vessel with ice free coolant and for short sample access2018
Automation of incubation, processing, harvesting and analysis of samples in a mu2017
Coaxial loudspeaker arrangement2017
Method and device for calculating a depth map from a single image2014
Devices and methods for detecting the position of a beam2005
Device for the precision rotation of samples2003