Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wide-field scanning probe microscope combined with an apparatus for modifying an object

Wide-field scanning probe microscope combined with an apparatus for modifying an object

US Patent 11237186 · Granted Feb 1, 2022

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and device for cooling of a superconducting cable and corresponding syste2025
Method and apparatus for separation of 13C16O from natural CO2023
Method and apparatus for producing carbon dioxide2022
Scanning probe nanotomograph comprising an optical analysis module2021
Scanning probe nanotomograph comprising an optical analysis module2021
Scanning probe nanotomograph comprising an optical analysis module2021
Scanning probe nanotomograph comprising an optical analysis module2021
Method and apparatus for cooling a load and system comprising corresponding appa2021
Oxy-fuel combustion and power generation system2020
Scanning probe microscope combined with a device for acting on a probe and a spe2020
Scanning probe microscope combined with a device for acting on a probe and a spe2020
Scanning probe microscope combined with a device for acting on a probe and a spe2020