Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for the characterization and monitoring of integrated circuits

Method for the characterization and monitoring of integrated circuits

US Patent 11169200 · Granted Nov 9, 2021

Estimated economic value: $5,376,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Single flux quantum circuitry for quantized flux bias control2024
RRAM filament spatial localization using a laser stimulation2024
RRAM filament spatial localization using a laser stimulation2024
Detection of an aged circuit2024
Detection of an aged circuit2024
ReRAM analog PUF using filament location2024
Physical unclonable function device with phase change2023
Tamper resistant obfuscation circuit2023
Machine learning-based circuit board inspection2023
Machine learning-based circuit board inspection2023
Tamper-resistant circuit, back-end of the line memory and physical unclonable fu2023
Using photonic emission to develop electromagnetic emission models2022