Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope and optical axis adjustment method in scanning probe microscope

Scanning probe microscope and optical axis adjustment method in scanning probe microscope

US Patent 11162974 · Granted Nov 2, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning probe microscope and method for measuring physical quantity using scann2025
Information providing system, server device, and analyzer2025
Scanning type probe microscope and control device for scanning type probe micro2022
Pattern height information correction system and pattern height information corr2022
Scanning probe microscope and optical axis adjustment method in scanning probe m2022
Data processing device for scanning probe microscope2020
Automatic analyzing apparatus2020
Data correction method, computer program for causing computer to perform data co2020
Scanning probe microscope2020
Scanning probe microscope and light intensity adjusting method2020
Recording/reproducing apparatus, recording apparatus, reproducing apparatus, rec2014
Digital recording/reproducing apparatus2009