Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement and testing system that includes a data processing device configured to synchronize first and second signals by using time-delayed values or reconstructed values occurring coincident with a transition of a digital time reference signal

Measurement and testing system that includes a data processing device configured to synchronize first and second signals by using time-delayed values or reconstructed values occurring coincident with a transition of a digital time reference signal

US Patent 11158422 · Granted Oct 26, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Motion base for displacing an object above a support surface2025
Force and/or motion measurement system that includes at least one kinematic sens2025
System for estimating a three dimensional pose of one or more persons in a scene2025
Hybrid display system for a force measurement assembly, an exercise device, or a2025
Swing analysis system2025
System for testing and/or training the vision of a user2025
Head-mounted display system2025
System for training neural networks that predict the parameters of a human mesh 2025
Measurement and testing system2024
Force measurement system2024
Force measurement system2024
System for estimating a pose of one or more persons in a scene2024