Method and system for detection of anomalies in surfaces

Assignee

• Wipro Limited

Inventors

• Rupesh Wasudevrao Kumbhare (1 patents)
• Deepak Dinkar (1 patents)
• Saravanan Solaiyappan (1 patents)
• Douglas B. Adams (7 patents)
• Thomas L. Kuczynski (1 patents)
• Hari Kurup (1 patents)
• Nichol Sowell (1 patents)
• Chad Rogers (4 patents)
• LaShema M. Burrell (1 patents)

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