Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method to measure semiconductor optical absorption using microwave charge sensing

Apparatus and method to measure semiconductor optical absorption using microwave charge sensing

US Patent 11125700 · Granted Sep 21, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Reusable filtering face mask2025
Respirator test system2024
Continuous full-resolution two-color infrared detector2023
Tunable infrared pixels having unpatterned graphene layer and conductive metasur2022
Tunable coherent light filter for optical sensing and imaging2022
Optical devices enabled by vertical dielectric Mie resonators2021
Tunable graphene-based infrared reflectance filter having patterned nanoantenna 2020
Superlattice photodetector having improved carrier mobility2018
Mid-infrared tunable metamaterials2017
Two-path plasmonic interferometer with integrated detector2016
Tunable plasmonic crystal2015
Mid-infrared tunable metamaterials2015