Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Control wafer and method for fabricating semiconductor device

Control wafer and method for fabricating semiconductor device

US Patent 11107737 · Granted Aug 31, 2021

Estimated economic value: $13,167,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display defect monitoring structure2025
Display defect monitoring structure2025
Image capturing device and image calculation method2025
Calibration method for emulating group III-V semiconductor device and method for2025
Test structure and testing method thereof2024
Test structure and testing method thereof2024
Transistor having asymmetric threshold voltage and buck converter2024
Semiconductor structure and manufacturing method thereof2023
Semiconductor structure and manufacturing method thereof2023
Heat exchange system having desired anti-scaling performance and an anti-scaling2023
Dead-time conduction loss reduction for buck power converters2022
Semiconductor structure and manufacturing method thereof2021