Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)

In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)

US Patent 11102596 · Granted Aug 24, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods and apparatus for outputting a haptic signal to a haptic transducer2025
In-sync digital waveform comparison to determine pass/fail results of a device u2023
In-sync digital waveform comparison to determine pass/fail results of a device u2023
Methods and apparatus for outputting a haptic signal to a haptic transducer2023
Measuring and evaluating a test signal generated by a device under test (DUT)2023
Measuring and evaluating a test signal generated by a device under test (DUT)2021
Methods and apparatus for outputting a haptic signal to a haptic transducer2020
Applications including multiple experience modules2017
Exhaust-gas turbocharger2017
Exhaust-gas turbocharger2016
Acoustic feedback cancellation system2010
Adaptive voice detection method and system2010