Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Fault detection and localization using combinatorial test design techniques while adhering to architectural restrictions

Fault detection and localization using combinatorial test design techniques while adhering to architectural restrictions

US Patent 11010282 · Granted May 18, 2021

Estimated economic value: $4,116,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Sustainable redundant array of inexpensive disks (RAID)2025
Sustainable redundant array of inexpensive disks (RAID)2025
Reinforcement learning for testing suite generation2025
Identification of related test cases and overlapping code under test2025
Dynamic testing with captured sequences of events2025
Modification-based multipathing code2025
Computer system test parallelization2025
Self diagnosing test suite using a double pair-wise combinatorial test solution2025
Self diagnosing test suite using a double pair-wise combinatorial test solution2025
Self diagnosing test suite using a double pair-wise combinatorial test solution2025
Resilient error handling through multipathing code2025
Multipathing code execution based on failure severity background2025