Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Film thickness measuring method and film thickness measuring apparatus

Film thickness measuring method and film thickness measuring apparatus

US Patent 11009340 · Granted May 18, 2021

Estimated economic value: $508,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display device having multiple protective films and wiring layer2023
Display device having multiple protective films and wiring layer2021
Display device and method of manufacturing display device2020
Thin film transistor and display device comprising the same2020
Catalytic converter and method for manufacturing casing2019
Gas detection device2019
Display device having multiple protective films2019
Thin film transistor and display device comprising the same2019
Film thickness measuring device and film thickness measuring method2017
Layer thickness measurement method2017
Metal complex, and adsorbent material, storage material and separation material 2017
Thin-film semiconductor device, organic EL display device, and manufacturing met2016