Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for actinic inspection of semiconductor masks

System for actinic inspection of semiconductor masks

US Patent 11002688 · Granted May 11, 2021

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System for actinic inspection of semiconductor masks2019
Dosimetric scintillating screen detector for charged particle radiotherapy quali2018
Dosimetric scintillating screen detector for charged particle radiotherapy quali2017
Applications of laser-processed substrate for molecular diagnostics2012
Laser-processed substrate for molecular diagnostics2012
Applications of laser-processed substrate for molecular diagnostics2011
Metalized semiconductor substrates for raman spectroscopy2010
Applications of laser-processed substrate for molecular diagnostics2009
High resolution proton beam monitor2009
Radiation camera with high spatial, temporal, and energy resolution2001
Achromatic diffractive optic1998
Verification device for currency containing an embedded security thread1995