Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for testing voltage monitors

System and method for testing voltage monitors

US Patent 10996266 · Granted May 4, 2021

Estimated economic value: $15,668,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

PORs testing in multiple power domain devices2025
Area, cost, and time-effective scan coverage improvement2025
Scan circuit and method2025
Test pattern generation using multiple scan enables2025
ATPG testing method for latch based memories, for area reduction2025
System and method for parallel testing of electronic device2025
System and method for parallel testing of electronic device2025
System and method for parallel testing of electronic device2025
TVF transition coverage with self-test and production-test time reduction2024
ATPG testing method for latch based memories, for area reduction2024
Reset and safe state logic generation in dual power flow devices2024
Self-test controller, and associated method2023