Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer-scale testing of photonic integrated circuits using horizontal spot-size converters

Wafer-scale testing of photonic integrated circuits using horizontal spot-size converters

US Patent 10964605 · Granted Mar 30, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods and systems for optical matrix calculation2025
Electric branch pruner2025
Wavelength locking2025
Wavelength division multiplexer2025
Optical circulator and optical module2025
Method for integration of electro-optical materials in a photonic integrated cir2025
Transverse-magnetic polarization silicon-photonic modulator2025
Optical reader device for multiplexed diagnostic systems and methods of use2025
Apparatus and method for a silicon modulator with strong gradient slab doping2025
Facet coupling fanout device2025
Wavelength locker2025
Wavelength locker2025