Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of performing single event upset testing

Method of performing single event upset testing

US Patent 10956265 · Granted Mar 23, 2021

Estimated economic value: $34,025,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Distributed virtual machine monitor for managing multiple virtual resources acro2014
Printer control based on head alignment2004
Status-based control over printer2003
Printer carriage control2002
Color printing using multiple inks2002
Automatic alignment of print heads2001
Dual head multicolor printing2001
Gas flow rate measurement apparatus and method2000
Paper turn-up system and method1995
Microprocessor controlled communications controller having a stretched clock cyc1984
Communication subsystem with an automatic abort transmission upon transmit under1983
Data processing system having apparatus in a communications subsystem for establ1983