Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Device and method for monitoring two-stage faults of TDM-PON with high precision

Device and method for monitoring two-stage faults of TDM-PON with high precision

US Patent 10944498 · Granted Mar 9, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Grinding machine2025
Phthalonitrile-based composite material, preparation method therefor and use the2025
Single-grain near-field transducer and process for forming same2025
Thin-film crystalline structure with surfaces having selected plane orientations2024
Magnetic holder for electronic equipment2024
Single-grain near-field transducer and process for forming same2024
Self-calibration detection device and temperature demodulation method oriented t2024
Radar ranging system based on true random generator and ranging method thereof2024
Heat-assisted magnetic recording head with a bilayer adhesion structure2024
High-precision temperature demodulation method oriented toward distributed fiber2023
System and method for generating millimeter wave noise with flat radio frequency2023
Heat-assisted magnetic recording head with nanoparticles2023