Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test methods for packaged integrated circuits

Test methods for packaged integrated circuits

US Patent 10859630 · Granted Dec 8, 2020

Estimated economic value: $4,464,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Robotic arm calibration method2025
Electronic device and waterproof member thereof2024
Method forming a semiconductor package device2024
NAND block architecture for in-memory multiply-and-accumulate operations2024
Data storage for artificial intelligence-based applications2024
Three-dimensional measuring device and robotic arm calibration method thereof2024
Memory device and wear leveling method for the same2023
Memory device for neural networks2022
Computation method and apparatus exploiting weight sparsity2022
Heat dissipation device and robot using same2022
Memory device and computing in memory method thereof2022
Memory devices and methods for operating the same2021