Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for simultaneously testing a component at multiple frequencies

Method and apparatus for simultaneously testing a component at multiple frequencies

US Patent 10838000 · Granted Nov 17, 2020

Estimated economic value: $10,472,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Digitally compensating for the impact of input bias current on current measureme2019
Digital approach to the removal of AC parasitics for impedance measurements2018