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Home › Measurement and testing system that includes a data processing device configured to synchronize a first plurality of data values with a second plurality of data values by determining which first timestamps correspond to which second timestamps and to interpolate values missing from the second values

Measurement and testing system that includes a data processing device configured to synchronize a first plurality of data values with a second plurality of data values by determining which first timestamps correspond to which second timestamps and to interpolate values missing from the second values

US Patent 10803990 · Granted Oct 13, 2020

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