Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Low profile embedded non-intrusive stress measurement system probe

Low profile embedded non-intrusive stress measurement system probe

US Patent 10794795 · Granted Oct 6, 2020

Estimated economic value: $16,692,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Coupling optical fibers and cooling fluid passages2025
Coupling optical fibers and cooling fluid passages2025
Blade tip clearance probe/lead cooling jacket2025
Blade tip clearance probe/lead cooling jacket2025
Nuclear reactor neutron reflector2025
Measurement system having a capacitance probe and an optical probe2025
Snowmobile side panel assembly2025
Anti-rotation feature for instrumentation of gas turbine engine2025
Snowmobile side panel assembly2025
Fitting for an instrument lead with a connector for a gas turbine engine2025
Golf swing training devices, systems and methods2025
Suspension component2025