Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and measurement system for identifying the noise figure of a device under test

Method and measurement system for identifying the noise figure of a device under test

US Patent 10761134 · Granted Sep 1, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Signal processing circuit and measurement system2025
Method and apparatus for an accurate determination of a transfer function of a d2025
Method and apparatus for an accurate determination of a transfer function of a d2025
Measurement system and method of determining a noise figure of a device under te2025
Measurement system and method of determining a noise figure of a device under te2025
Apparatus and method for generating an output signal with adjustable phase noise2025
Detector circuit, signal processing circuit, and measurement instrument2025
Measurement application device calibration unit, measurement system, method2025
Measurement application device, and method2025
Measurement application device calibration unit, measurement system, method2025
Signal processing method and signal processing system2025
Radio frequency testing apparatus with voltage standing wave ratio adjustment an2025