Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for inline parts average testing and latent reliability defect detection

Methods and systems for inline parts average testing and latent reliability defect detection

US Patent 10761128 · Granted Sep 1, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Imaging reflectometry for inline screening2025
Imaging reflectometry for inline screening2025
System for automatic diagnostics and monitoring of semiconductor defect die scre2025
System for automatic diagnostics and monitoring of semiconductor defect die scre2025
System and method to weight defects with co-located modeled faults2024
System and method to weight defects with co-located modeled faults2024
Systems and methods for semiconductor adaptive testing using inline defect part 2023
Systems and methods for semiconductor adaptive testing using inline defect part 2023
Systems and methods for semiconductor adaptive testing using inline defect part 2023
System and method for identifying latent reliability defects in semiconductor de2023
System and method for identifying latent reliability defects in semiconductor de2023
System and method for identifying latent reliability defects in semiconductor de2023