Methods and systems for pattern characteristic detection

Assignee

• Columbia University
• Cornell University

Inventors

• Alan Chad DeChant (1 patents)
• Hod Lipson (31 patents)
• Rebecca J. Nelson (1 patents)
• Michael A. Gore (1 patents)
• Tyr Wiesner-Hanks (1 patents)
• Ethan Stewart (1 patents)
• Jason Yosinski (4 patents)
• Siyuan Chen (51 patents)

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