Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Multi-beam charged particle system

Multi-beam charged particle system

US Patent 10741355 · Granted Aug 11, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multiple particle beam microscope and associated method with fast autofocus arou2025
Method for operating a multi-beam particle beam microscope2025
Multi-beam digital scan and image acquisition2025
Particle beam system including a multi-beam deflection device and a beam stop, m2025
Particle beam system including a multi-beam deflection device and a beam stop, m2025
System comprising a multi-beam particle microscope and method for operating the 2025
Particle beam system2025
Multiple particle beam microscope and associated method with an improved focus s2025
Multiple particle beam microscope and associated method with an improved focus s2025
Method for area-wise inspecting a sample via a multi-beam particle microscope, c2025
Multi-beam particle beam system and method for operating same2025
Multi-beam particle beam system and method for operating same2025