Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Noise detection circuit capable of recognizing noise event occurring in device under test, and related system and method for testing device under test

Noise detection circuit capable of recognizing noise event occurring in device under test, and related system and method for testing device under test

US Patent 10698018 · Granted Jun 30, 2020

Estimated economic value: $6,536,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

All-digital duty cycle corrector and method for correcting duty cycle of output 2025
System and method for fabricating a semiconductor device2025
Metal-oxide-metal cell semiconductor device and method2025
Delay measurement system and measurement method2024
Middle end of line decoupling capacitors for semiconductor devices and methods o2024
Integrated circuits having signal lines formed with double patterning2024
Integrated circuit structure of capacitive device2024
Analog cells utilizing complementary mosfet pairs2024
Two-step charge-based capacitor measurement2024
Generation of layout including power delivery network2024
Semiconductor device and a method for fabricating the same2024
Circuitry and method for reducing environmental noise2024