{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components", "item": "https://www.patentleaderboard.com/patent/10634629"}]}

Home › Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components

Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components

US Patent 10634629 · Granted Apr 28, 2020

Assignee

Inventors

Ashok R. Saxena (9 patents)
Unknown
Kee Bong Yoon (3 patents)

View full patent text on Google Patents →