Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › X-ray spectroscopy in a charged-particle microscope

X-ray spectroscopy in a charged-particle microscope

US Patent 10620142 · Granted Apr 14, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multiple image segmentation and/or multiple dynamic spectral acquisition for mat2025
System and method for vegetation management risk assessment and resolution2021
Automated mineral classification2017
Mineral identification using sequential decomposition into elements from mineral2017
Sample-specific reference spectra library2017
Sample-specific reference spectra library2017
Sub-pixel analysis and display of fine grained mineral samples2017
Sub-pixel analysis and display of fine grained mineral samples2017
Blend modes for mineralogy images2016
Automated EDS standards calibration2015
Blend modes for mineralogy images2015
Mineral identification using mineral definitions having compositional ranges2015