Ophthalmic analysis device and ophthalmic analysis program

Assignee

• Nidek Co.

Inventors

• Ryosuke SHIBA (19 patents)
• Norimasa Satake (26 patents)
• Tetsuya KANO (12 patents)
• Yasuhiro FURUUCHI (15 patents)
• Yuki Kuno (4 patents)
• Ai TAKAYA (4 patents)
• Naoki Takeno (17 patents)
• Yukihiro Higuchi (29 patents)
• Hajime NAMIKI (9 patents)

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