{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Detecting deviations between event log and process model", "item": "https://www.patentleaderboard.com/patent/10452987"}]}

Home › Detecting deviations between event log and process model

Detecting deviations between event log and process model

US Patent 10452987 · Granted Oct 22, 2019

Estimated economic value: $3,154,000 ⓘ

Assignee

IBM

Inventors

Jing Li (123 patents)
Xiang Li (34 patents)
Haifeng Liu (99 patents)
Guo Tong Xie (43 patents)
Yi Qin Yu (28 patents)
Shi Lei Zhang (48 patents)

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