Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for utilizing stand-alone controller in multiplexed handler test cell for indexless tandem semiconductor test

Method and system for utilizing stand-alone controller in multiplexed handler test cell for indexless tandem semiconductor test

US Patent 10422828 · Granted Sep 24, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for semiconductor device interface circuitry functionality and compliance2025
Device interface board compliance testing using impedance response profiling2024
Method for semiconductor device interface circuitry functionality and compliance2024
Method for in situ functionality testing of switches and contacts in semiconduct2023
Method for continuous tester operation during long soak time testing2022
Method for continuous tester operation during multiple stage temperature testing2019
Modular multiplexing interface assembly for reducing semiconductor testing index2019
Method for testing semiconductor wafers using temporary sacrificial bond pads2018
Parallel concurrent test system and method2017
Semiconductor device handler throughput optimization2017
Muxing interface platform for multiplexed handlers to reduce index time system a2017
Universal multiplexing interface system and method2017