Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and circuits for improved reliability of power devices operating under repetitive thermal stress

Methods and circuits for improved reliability of power devices operating under repetitive thermal stress

US Patent 10411693 · Granted Sep 10, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Current measuring circuit2025
Power transistor device including first and second transistor cells having diffe2021
Transistor arrangement with a load transistor and a sense transistor2021
Thermal protection for light emitting devices2019
Television functionality on a chip2014
Circuits and methods for battery charging2011
Television functionality on a chip2011
Packetization of non-MPEG stream data in systems using advanced multi-stream POD2011
Television functionality on a chip2009
System and method for generating multiple independent, synchronized local timest2008