Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and devices for reducing device test time

Methods and devices for reducing device test time

US Patent 10339448 · Granted Jul 2, 2019

Estimated economic value: $18,722,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods, devices, and systems for reducing device test time2020
Preventing data storage device failure due to changes in head fly height2019
Methods, devices, and systems for establishing fly-height parameters for hard di2019
High rpm hard disk drive testing2019
Adaptive cleaning of a media surface responsive to a mechanical disturbance even2019
Non-contact fly height calibration and compensation2015
MR-offset change detection and compensation2015
Head fly height testing and compensation2014
Multi-tracks MR offset tuning based on error count in certification process2007
User data wedge media certification apparatus and method2005
Method and apparatus for increasing process yields of data storage devices2004
Disc drive pattern zero verification test2004