Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample

Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample

US Patent 10288643 · Granted May 14, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical element exchange unit2025
Device for mounting a load to a carrier, assembly, vehicle and methods2025
Controllably deformable mirror device2025
Electromagnetically controlled segmented mirror, electromagnetic actuator for us2024
Directable light beam handling device for optical communication2023
Method of positioning a carrier on a flat surface, and assembly of a carrier and2023
Device and method for positioning a moveable member, and a steerable mirror unit2022
Optical assembly with high accuracy stable alignment between optical surfaces2021
Optical coherence tomography method, system and computer program product therefo2020
Method of determining an overlay error, manufacturing method and system for manu2020
Method of positioning a carrier on a flat surface, and assembly of a carrier and2019
Positioning arm for and method of placing a scan head on a support surface2019