Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for determining abnormal equipment in semiconductor manufacturing system and program product

Method for determining abnormal equipment in semiconductor manufacturing system and program product

US Patent 10274942 · Granted Apr 30, 2019

Estimated economic value: $121,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High-speed autofocus control2025
Semiconductor structure and method for manufacturing the same2024
Semiconductor memory device and fabrication method thereof2024
Semiconductor memory device and fabrication method thereof2023
Extraction methods of field muskmelon seed oil2021
Circular scanning technique for large area imaging2020
Integration method for accurate modeling and analysis and reliability-based desi2020
Circular scanning technique for large area inspection2019
Interconnect structure and fabricating method thereof2019
Semiconductor memory cell structure2018