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Quality inspection of thin film materials

US Patent 10267836 · Granted Apr 23, 2019

Assignee

Asociación Centro De Investigación Cooperativa En Nanociencias “Cic Nanogune”
Graphenea S.A.

Inventors

Eduardo AZANZA LADRÓN (1 patents)
Magdalena CHUDZIK (1 patents)
Alex López Zorzano (1 patents)
David Etayo Salinas (1 patents)
Luis Eduardo Hueso Arroyo (1 patents)
Amaia ZURUTUZA ELORZA (5 patents)

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