Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Margin test for one-time programmable memory (OTPM) array with common mode current source

Margin test for one-time programmable memory (OTPM) array with common mode current source

US Patent 10255987 · Granted Apr 9, 2019

Estimated economic value: $34,923,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

On-chip reliability monitor and method2025
Charge pump circuit with internal pre-charge configuration2021
Selection circuit2020
Ultra-low voltage level shifter2020
Voltage boost circuit2020
Charge pump circuit with built-in-retry2020
High speed level translator2020
Latching current sensing amplifier for memory array2020
Memory array including distributed reference cells for current sensing2019
Voltage boost circuit2019
On-chip reliability monitor and method2019
Margin test for multiple-time programmable memory (MTPM) with split wordlines2019