Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated measuring system for the spectral measuring technique

Integrated measuring system for the spectral measuring technique

US Patent 10217890 · Granted Feb 26, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for correcting a spherical aberration of a microscope, and microscope2024
Microscope and method for generating an overview image of a sample2024
Method and microscope for determining the thickness of a cover slip or slide2024
Method and microscope for determining the refractive index of an optical medium2023
Light sheet microscope and method for determining the refractive indices of obje2022
Parameterized model of 2D articulated human shape2022
Machine learning systems and methods for extracting user body shape from behavio2022
Microscope and method for determining an aberration in a microscope2022
Device and method for feeding an immersion medium2022
Parameterized model of 2D articulated human shape2021
Method for imaging in a microscope with oblique illumination2020
Machine learning systems and methods of estimating body shape from images2020