Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Machine vision inspection system and method for obtaining an image with an extended depth of field

Machine vision inspection system and method for obtaining an image with an extended depth of field

US Patent 10178321 · Granted Jan 8, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Supplementary metrology position coordinates determination system including an a2023
Workpiece inspection and defect detection system including monitoring of workpie2022
System and method utilizing multi-point autofocus to align an optical axis of an2022
Workpiece inspection and defect detection system indicating number of defect ima2021
Robot system with end tool metrology position coordinates determination system2021
Metrology system with transparent workpiece surface mode2020
Variable focal length lens system with optical power monitoring2019
Variable focal length lens system including a focus state reference subsystem2019
Variable focal length lens system including a focus state reference subsystem2019
Variable focal length lens system with multi-level extended depth of field image2018
Autofocus system for a high speed periodically modulated variable focal length l2018
Variable focal length imaging system2018