Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Real-time analysis and control of electron beam manufacturing process through x-ray computed tomography

Real-time analysis and control of electron beam manufacturing process through x-ray computed tomography

US Patent 10113981 · Granted Oct 30, 2018

Estimated economic value: $60,283,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Remote measurement of shallow depths in semi-transparent media2025
Remote measurement of shallow depths in semi-transparent media2024
Remote measurement of shallow depths in semi-transparent media2024
Remote measurement of shallow depths in semitransparent media2023
Remote measurement of shallow depths in semi-transparent media2023
Remote measurement of shallow depths in semi-transparent media2022
Remote measurement of shallow depths in semi-transparent media2022
Remote measurement of shallow depths in semi-transparent media2020
Remote measurement of shallow depths in semi-transparent media2016
System decomposition via evolutionary programming2012
System and method to centrifugally cast munitions2010
Augmented reality traffic control center2006