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Home › Device and method for characterization of a light beam to determine space time couplings in the light beam using a two-dimensional interference pattern formed by the light beam and a fourier transform

Device and method for characterization of a light beam to determine space time couplings in the light beam using a two-dimensional interference pattern formed by the light beam and a fourier transform

US Patent 10107692 · Granted Oct 23, 2018

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