Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › X-ray analytical instrument with improved control of detector cooling and bias supply

X-ray analytical instrument with improved control of detector cooling and bias supply

US Patent 10094936 · Granted Oct 9, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

XRF analyzer with improved resolution by using micro-reset2022
X-ray analytical instrument with improved control of detector cooling and bias s2019
Method and apparatus for X-ray detection system gain calibration using a pulser2019
Technique for sub-microsecond latency measurement across a bus2019
FPGA matrix architecture2018
FPGA matrix architecture2016