Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Optical measurement element for alignment in wafer-level testing and method for aligning an optical probe using the same

Optical measurement element for alignment in wafer-level testing and method for aligning an optical probe using the same

US Patent 10088299 · Granted Oct 2, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical element2021
Photodetector having one-dimensional grating structure2020
Grating structure, and manufacturing method of grating coupler provided therewit2018
Grating coupler with high optical coupling efficiency for SMF2018
Optical circuit2016
Optical conversion element and optical conversion element manufacturing method2014
Wavelength filter2014
Optical control device2013
Optical switch2013
Optical switch and manufacturing method thereof2013
Photonic crystal element2013
Optical waveguide2013