Assignee
- Mettler-Toledo (Changzhou) Precision Instruments
- Mettler-Toledo (Changzhou) Measurement Technology
- Metter Toledo (Changzhou) Scale & System
Inventors
- Ying Zhang (83 patents)
- Shaowen Zheng (3 patents)
- Jianwei Wu (10 patents)
US Patent 10048109 · Granted Aug 14, 2018